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Proceedings Paper

Adaptive optics wide-field microscope corrections using a MEMS DM and Shack-Hartmann wavefront sensor
Author(s): Oscar Azucena; Xiaodong Tao; Justin Crest; Shaila Kotadia; William Sullivan; Donald Gavel; Marc Reinig; Scot Olivier; Joel Kubby
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Paper Abstract

We demonstrated the used of an adaptive optic system in biological imaging to improve the imaging characteristics of a wide field microscope. A crimson red fluorescent bead emitting light at 650 nm was used together with a Shack-Hartmann wavefront sensor and deformable mirror to compensate for the aberrations introduce by a Drosophila embryo. The measurement and correction at one wavelength improves the resolving power at a different wavelength, enabling the structure of the sample to be resolved (510 nm). The use of the crimson beads allow for less photobleaching to be done to the science object of the embryo, in this case our GFP model (green fluorescent beads), and allows for the science object and wavefront reference to be spectrally separated. The spectral separation allows for single points sources to be used for wavefront measurements, which is a necessary condition for the Shack-Hartmann Wavefront sensor operation.

Paper Details

Date Published: 14 February 2011
PDF: 6 pages
Proc. SPIE 7931, MEMS Adaptive Optics V, 79310J (14 February 2011); doi: 10.1117/12.876439
Show Author Affiliations
Oscar Azucena, Univ. of California, Santa Cruz (United States)
Xiaodong Tao, Univ. of California, Santa Cruz (United States)
Justin Crest, Univ. of California, Santa Cruz (United States)
Shaila Kotadia, Univ. of California, Santa Cruz (United States)
William Sullivan, Univ. of California, Santa Cruz (United States)
Donald Gavel, Univ. of California, Santa Cruz (United States)
Marc Reinig, Univ. of California, Santa Cruz (United States)
Scot Olivier, Lawrence Livermore National Lab. (United States)
Joel Kubby, Univ. of California, Santa Cruz (United States)


Published in SPIE Proceedings Vol. 7931:
MEMS Adaptive Optics V
Scot S. Olivier; Thomas G. Bifano; Joel A. Kubby, Editor(s)

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