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Proceedings Paper

Spectral-based 2D/3D X-ray to CT image rigid registration
Author(s): M. Freiman; O. Pele; A. Hurvitz; M. Werman; L. Joskowicz
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Paper Abstract

We present a spectral-based method for the 2D/3D rigid registration of X-ray images to a CT scan. The method uses a Fourier-based representation to decompose the six rigid transformation parameters problem into a twoparameter out-of-plane rotation and a four-parameter in-plane transformation problems. Preoperatively, a set of Digitally Reconstructed Radiographs (DRRs) are generated offline from the CT in the expected in-plane location ranges of the fluoroscopic X-ray imaging devices. Each DRR is transformed into a imaging device in-plane invariant features space. Intraoperatively, a few 2D projections of the patient anatomy are acquired with an X-ray imaging device. Each projection is transformed into its in-plane invariant representation. The out-of-plane parameters are first computed by maximization of the Normalized Cross-Correlation between the invariant representations of the DRRs and the X-ray images. Then, the in-plane parameters are computed with the phase correlation method based on the Fourier-Mellin transform. Experimental results on publicly available data sets show that our method can robustly estimate the out-of-plane parameters with accuracy of 1.5° in less than 1sec for out-of-plane rotations of 10° or more, and perform the entire registration in less than 10secs.

Paper Details

Date Published: 1 March 2011
PDF: 7 pages
Proc. SPIE 7964, Medical Imaging 2011: Visualization, Image-Guided Procedures, and Modeling, 79641B (1 March 2011); doi: 10.1117/12.876365
Show Author Affiliations
M. Freiman, The Hebrew Univ. of Jerusalem (Israel)
O. Pele, The Hebrew Univ. of Jerusalem (Israel)
A. Hurvitz, The Hebrew Univ. of Jerusalem (Israel)
M. Werman, The Hebrew Univ. of Jerusalem (Israel)
L. Joskowicz, The Hebrew Univ. of Jerusalem (Israel)

Published in SPIE Proceedings Vol. 7964:
Medical Imaging 2011: Visualization, Image-Guided Procedures, and Modeling
Kenneth H. Wong; David R. Holmes III, Editor(s)

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