Share Email Print
cover

Proceedings Paper

Highly simplified device for measuring the intensity and phase of picosecond pulses
Author(s): Jacob Cohen; Dongjoo Lee; Vikrant Chauhan; Peter Vaughan; Rick Trebino
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We demonstrate an extremely simple frequency-resolved-optical-gating (GRENOUILLE) device for measuring the intensity and phase of relatively long-ps-pulses. In order to achieve the required high spectral resolution and large temporal range, it uses a few-cm-thick second-harmonic-generation crystal in the shape of a pentagon. This has the additional advantage of reducing the device's total number of components to as few as three simple easily aligned optics, making it the simplest device ever developed for complete pulse measurement. We report complete intensity-and-phase measurements of pulses up to 15ps long with a time-bandwidth product of 21.

Paper Details

Date Published: 21 February 2011
PDF: 13 pages
Proc. SPIE 7917, Nonlinear Frequency Generation and Conversion: Materials, Devices, and Applications X, 79170V (21 February 2011); doi: 10.1117/12.876262
Show Author Affiliations
Jacob Cohen, Georgia Institute of Technology (United States)
Dongjoo Lee, Georgia Institute of Technology (United States)
Vikrant Chauhan, Georgia Institute of Technology (United States)
Peter Vaughan, Georgia Institute of Technology (United States)
Rick Trebino, Georgia Institute of Technology (United States)


Published in SPIE Proceedings Vol. 7917:
Nonlinear Frequency Generation and Conversion: Materials, Devices, and Applications X
Konstantin L. Vodopyanov, Editor(s)

© SPIE. Terms of Use
Back to Top