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Proceedings Paper

High-precision three-dimensional position measurement of particles by digital Gabor holography
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Paper Abstract

A single exposure of digital Gabor holography (DGH) is used for simultaneous three-dimensional measurement of particle position. The particle sample is set up such that its position can be electro-mechanically manipulated using calibrated piezoelectric transducers in both the lateral and axial directions. The central position of the reconstructed image of the particle is determined by low-pass filtering, thresholding, and center-of-mass calculation. We have obtained less than 20 nm resolution in both the lateral and axial directions in a direct and unambiguous manner. The method is applied to calibration of optical trap strength.

Paper Details

Date Published: 11 February 2011
PDF: 7 pages
Proc. SPIE 7908, Nanoscale Imaging, Sensing, and Actuation for Biomedical Applications VIII, 790806 (11 February 2011); doi: 10.1117/12.876249
Show Author Affiliations
Myung K. Kim, Univ. of South Florida (United States)
Mariana C. Potcoava, Colorado School of Mines (United States)
Leo G. Krzewina, Univ. of South Florida (United States)


Published in SPIE Proceedings Vol. 7908:
Nanoscale Imaging, Sensing, and Actuation for Biomedical Applications VIII
Alexander N. Cartwright; Dan V. Nicolau, Editor(s)

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