Share Email Print

Proceedings Paper

Imaging using synchrotron radiation for forensic science
Author(s): F. Cervelli; S. Carrato; A. Mattei; M. Jerian; L. Benevoli; L. Mancini; F. Zanini; L. Vaccari; A. Perucchi; G. Aquilanti
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Forensic science is already taking benefits from synchrotron radiation (SR) sources in trace evidence analysis. In this contribution we show a multi-technique approach to study fingerprints from the morphological and chemical point of view using SR based techniques such as Fourier transform infrared microspectroscopy (FTIRMS), X-ray fluorescence (XRF), X-ray absorption structure (XAS), and phase contrast microradiography. Both uncontaminated and gunshot residue contaminated human fingerprints were deposited on lightly doped silicon wafers and on poly-ethylene-terephthalate foils. For the uncontaminated fingerprints an univariate approach of functional groups mapping to model FT-IRMS data was used to get the morphology and the organic compounds map. For the gunshot residue contaminated fingerprints, after a preliminary elemental analysis using XRF, microradiography just below and above the absorption edge of the elements of interest has been used to map the contaminants within the fingerprint. Finally, XAS allowed us to determine the chemical state of the different elements. The next step will be fusing the above information in order to produce an exhaustive and easily understandable evidence.

Paper Details

Date Published: 3 February 2011
PDF: 9 pages
Proc. SPIE 7870, Image Processing: Algorithms and Systems IX, 78700B (3 February 2011); doi: 10.1117/12.876118
Show Author Affiliations
F. Cervelli, Univ. degli Studi di Trieste (Italy)
S. Carrato, Univ. degli Studi di Trieste (Italy)
A. Mattei, Reparto Investigazioni Scientifiche dei Carabinieri (Italy)
M. Jerian, Amped (Italy)
L. Benevoli, Sincrotrone Trieste (Italy)
L. Mancini, Sincrotrone Trieste (Italy)
F. Zanini, Sincrotrone Trieste (Italy)
L. Vaccari, Sincrotrone Trieste (Italy)
A. Perucchi, Sincrotrone Trieste (Italy)
G. Aquilanti, Sincrotrone Trieste (Italy)

Published in SPIE Proceedings Vol. 7870:
Image Processing: Algorithms and Systems IX
Jaakko T. Astola; Karen O. Egiazarian, Editor(s)

© SPIE. Terms of Use
Back to Top