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Proceedings Paper

Wide-field reflection phase microscope
Author(s): Zahid Yaqoob; Toyohiko Yamauchi; Dan Fu; Wonshik Choi; Ramachandra R. Dasari; Michael S. Feld
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Paper Abstract

Wide-field reflection phase microscopy is highly desired for depth-resolved measurement of cellular structures without the need for raster scanning. We report a low coherence reflection phase microscope based on time-domain optical coherence tomography and off-axis interferometry. The setup uniquely provides the desired angular shift to the reference beam for off-axis interferometry while promising equal path length across the whole reference beam. We show sub-nanometer path-length sensitivity of our instrument and demonstrate high-speed imaging of membrane fluctuations in eukaryotic cells.

Paper Details

Date Published: 23 February 2011
PDF: 6 pages
Proc. SPIE 7904, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XVIII, 79040T (23 February 2011); doi: 10.1117/12.875877
Show Author Affiliations
Zahid Yaqoob, Massachusetts Institute of Technology (United States)
Toyohiko Yamauchi, Hamamatsu Photonics K.K. (Japan)
Dan Fu, Massachusetts Institute of Technology (United States)
Wonshik Choi, Korea Univ. (Korea, Republic of)
Ramachandra R. Dasari, Massachusetts Institute of Technology (United States)
Michael S. Feld, Massachusetts Institute of Technology (United States)


Published in SPIE Proceedings Vol. 7904:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XVIII
Jose-Angel Conchello; Carol J. Cogswell; Tony Wilson; Thomas G. Brown, Editor(s)

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