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Proceedings Paper

Reliability of high power diode laser systems based on single emitters
Author(s): Paul Leisher; Mitch Reynolds; Aaron Brown; Keith Kennedy; Ling Bao; Jun Wang; Mike Grimshaw; Mark DeVito; Scott Karlsen; Jay Small; Chris Ebert; Rob Martinsen; Jim Haden
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Paper Abstract

Diode laser modules based on arrays of single emitters offer a number of advantages over bar-based solutions including enhanced reliability, higher brightness, and lower cost per bright watt. This approach has enabled a rapid proliferation of commercially available high-brightness fiber-coupled diode laser modules. Incorporating ever-greater numbers of emitters within a single module offers a direct path for power scaling while simultaneously maintaining high brightness and minimizing overall cost. While reports of long lifetimes for single emitter diode laser technology are widespread, the complex relationship between the standalone chip reliability and package-induced failure modes, as well as the impact of built-in redundancy offered by multiple emitters, are not often discussed. In this work, we present our approach to the modeling of fiber-coupled laser systems based on single-emitter laser diodes.

Paper Details

Date Published: 21 February 2011
PDF: 7 pages
Proc. SPIE 7918, High-Power Diode Laser Technology and Applications IX, 791802 (21 February 2011); doi: 10.1117/12.875858
Show Author Affiliations
Paul Leisher, nLIGHT Corp. (United States)
Mitch Reynolds, nLIGHT Corp. (United States)
Aaron Brown, nLIGHT Corp. (United States)
Keith Kennedy, nLIGHT Corp. (United States)
Ling Bao, nLIGHT Corp. (United States)
Jun Wang, nLIGHT Corp. (United States)
Mike Grimshaw, nLIGHT Corp. (United States)
Mark DeVito, nLIGHT Corp. (United States)
Scott Karlsen, nLIGHT Corp. (United States)
Jay Small, nLIGHT Corp. (United States)
Chris Ebert, nLIGHT Corp. (United States)
Rob Martinsen, nLIGHT Corp. (United States)
Jim Haden, nLIGHT Corp. (United States)

Published in SPIE Proceedings Vol. 7918:
High-Power Diode Laser Technology and Applications IX
Mark S. Zediker, Editor(s)

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