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Proceedings Paper

Oscillation frequency shifts observed in vertical cavity surface emitting lasers exposed to magnetic fields
Author(s): T. Kobayashi; Y. Yamagishi; H. Arai; Y. Matsumoto; T. Sato; M. Ohkawa
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Paper Abstract

As long ago as the 1960s, scientists understood that Diode lasers' oscillation wavelengths showed a significant shift to the shorter wavelength (high frequency) side, when exposed to strong (<4[T]) magnetic fields, at extremely low temperatures (<80[K]). Not surprisingly, then, in preliminary tests, when we exposed Fabry/Perot-type diode lasers oscillating at 780[nm] to weak magnetic fields (<1.4[T]), at room temperature (300[K]), we observed that the oscillation wavelength shifted to the longer (low frequency) wavelength side. In the present work, we used vertical-cavity surface-emitting lasers (VCSEL) to check whether its change into the shorter wavelength side takes place. In discussions of shift mechanisms, we consider how wavelength (frequency) and optical output-power shifts are correlated. Our expanded knowledge base has forced us to use a completely different mechanism to explain how/why our results differ from those obtained in studies conducted in the 1960's. We are now introducing a mechanism that affects a rise in temperature and an increase in the carrier density, affect the characteristic shifts observed in our experiments, when a magnetic field is applied to the laser diodes parallel to the injection current.

Paper Details

Date Published: 21 February 2011
PDF: 8 pages
Proc. SPIE 7933, Physics and Simulation of Optoelectronic Devices XIX, 79331O (21 February 2011); doi: 10.1117/12.875851
Show Author Affiliations
T. Kobayashi, Niigata Univ. (Japan)
Y. Yamagishi, Niigata Univ. (Japan)
H. Arai, Niigata Univ. (Japan)
Y. Matsumoto, Niigata Univ. (Japan)
T. Sato, Niigata Univ. (Japan)
M. Ohkawa, Niigata Univ. (Japan)


Published in SPIE Proceedings Vol. 7933:
Physics and Simulation of Optoelectronic Devices XIX
Bernd Witzigmann; Fritz Henneberger; Yasuhiko Arakawa; Alexandre Freundlich, Editor(s)

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