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Proceedings Paper

Mitigation of thermal lensing effect as a brightness limitation of high-power broad area diode lasers
Author(s): John G. Bai; Paul Leisher; Shiguo Zhang; Sandrio Elim; Mike Grimshaw; Chendong Bai; Louis Bintz; David Dawson; Ling Bao; Jun Wang; Mark DeVito; Rob Martinsen; Jim Haden
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Paper Abstract

Recent efforts to improve the reliability of high-power broad-area diode lasers operating in the 9xx nm wavelength band have yielded single emitter devices with excellent reliability to >15 W. However, in applications requiring fiber coupling, the fiber coupling power of a single emitter device is rather limited by its linear power density, and hence brightness of the device. Unfortunately, due to a rapid increase in the slow-axis divergence, a typical broad-area diode laser offers a much lower brightness increase and an earlier rollover than its output power. In this work, we show that thermal lensing (rather than carrier- or gain-induced guiding) in the slow axis is the predominant cause of beam quality degradation at increased driving current. Some of the techniques which are presented include the use of cavity length scaling and thermal path engineering. It is expected these approaches are critical to enabling continued scaling of highbrightness fiber coupled diode lasers.

Paper Details

Date Published: 16 February 2011
PDF: 7 pages
Proc. SPIE 7953, Novel In-Plane Semiconductor Lasers X, 79531F (16 February 2011); doi: 10.1117/12.875849
Show Author Affiliations
John G. Bai, nLIGHT Corp. (United States)
Paul Leisher, nLIGHT Corp. (United States)
Shiguo Zhang, nLIGHT Corp. (United States)
Sandrio Elim, nLIGHT Corp. (United States)
Mike Grimshaw, nLIGHT Corp. (United States)
Chendong Bai, nLIGHT Corp. (United States)
Louis Bintz, nLIGHT Corp. (United States)
David Dawson, nLIGHT Corp. (United States)
Ling Bao, nLIGHT Corp. (United States)
Jun Wang, nLIGHT Corp. (United States)
Mark DeVito, nLIGHT Corp. (United States)
Rob Martinsen, nLIGHT Corp. (United States)
Jim Haden, nLIGHT Corp. (United States)


Published in SPIE Proceedings Vol. 7953:
Novel In-Plane Semiconductor Lasers X
Alexey A. Belyanin; Peter M. Smowton, Editor(s)

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