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Proceedings Paper

Broadband source for sensor characterization
Author(s): Jason A. Mazzetta; Miguel A. Medina; Stephen D. Scopatz
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Paper Abstract

Continued innovation with optical components and optical materials not only increases the utility and value of optical sensors and devices, it also mandates the development of new test methods and test hardware. Thus, in order to evaluate the enhanced performance of these new optical components and systems - SWIR imagers, silicon-based photodetectors, and single-photon detectors; as well as detectors that may utilize novel materials for highly specific spectral regions - equally enhanced test and measurement equipment must be used. A task such as this is greatly simplified for these detectors when a minimal amount of hardware can be used to test, measure, and calibrate the benchmarks of their performance; benchmarks such as SNR, uniformity, sensitivity, linearity, and dynamic range. The role of the test hardware is driven by its ability to provide high resolution, uniform, and stable broadband output. A broadband source encompassing the UV through the SWIR region of the electromagnetic spectrum capable of producing high daylight irradiance levels down to low star light irradiance levels. All of this functionality is integrated into one calibrated test set. A test set that is robust but does not sacrifice precision and accuracy. This paper will explore characterization testing and the advantages and drawbacks of various types of broadband sources spanning UV through SWIR over a high dynamic range of output. This paper will further suggest standardization of test methods and presentation of results (for example, SNR) such that results from various detectors can be compared directly.

Paper Details

Date Published: 23 February 2011
PDF: 12 pages
Proc. SPIE 7934, Optical Components and Materials VIII, 79341K (23 February 2011); doi: 10.1117/12.875464
Show Author Affiliations
Jason A. Mazzetta, Electro Optical Industries, Inc. (United States)
Miguel A. Medina, Electro Optical Industries, Inc. (United States)
Stephen D. Scopatz, Electro Optical Industries, Inc. (United States)

Published in SPIE Proceedings Vol. 7934:
Optical Components and Materials VIII
Michel J. F. Digonnet; Shibin Jiang; John W. Glesener; J. Christopher Dries, Editor(s)

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