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Proceedings Paper

Optical near field in silicon photonics
Author(s): R. Salas-Montiel; A. Apuzzo; A. Bruyant; P. Royer; G. Lérondel; S. Blaize
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Paper Abstract

Optical devices based on SOI have been fabricated and tested for the last decade by using far field optics. Alternatively, near-field scanning optical microscopes (NSOM) have the ability to reach unique optical resolution by converting the evanescent waves into radiation waves that can be detected by conventional far field optics. Thus, the aim of this paper is to show the most recent capabilities of the NSOM in a guided detection to probe SOI-based structures. By using this simple yet powerful configuration, we can observe the propagation of the light in Si-based devices and thus measure the propagation characteristics of the guided modes.

Paper Details

Date Published: 17 January 2011
PDF: 12 pages
Proc. SPIE 7943, Silicon Photonics VI, 79430S (17 January 2011); doi: 10.1117/12.875235
Show Author Affiliations
R. Salas-Montiel, Univ. de Technologie Troyes (France)
A. Apuzzo, Univ. de Technologie Troyes (France)
A. Bruyant, Univ. de Technologie Troyes (France)
P. Royer, Univ. de Technologie Troyes (France)
G. Lérondel, Univ. de Technologie Troyes (France)
S. Blaize, Univ. de Technologie Troyes (France)

Published in SPIE Proceedings Vol. 7943:
Silicon Photonics VI
Joel A. Kubby; Graham T. Reed, Editor(s)

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