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Proceedings Paper

Comparison of two-­dimensional phase retrieval methods from single interference fringe pattern
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Paper Abstract

Accurate phase retrieval from single fringe pattern is significant for dynamic phase measurement. Although it brings issues of speckle noise and severe non-sinusoidal waveform, the interference fringe pattern by coherent light is still often used for profile measurement, especially for measuring target with low reflective surface. Both simulation and experiment are carried out to study performance of two-dimensional Fourier transform, windowed Fourier transform(including windowed Fourier filtering and windowed Fourier ridges), and wavelet transform methods. The influence of the speckle noise and non-sinusoidal waveform to those phase retrieval methods is compared and discussed.

Paper Details

Date Published: 16 November 2010
PDF: 10 pages
Proc. SPIE 7851, Information Optics and Optical Data Storage, 785107 (16 November 2010); doi: 10.1117/12.875071
Show Author Affiliations
Huang Lei, Nanyang Technological Univ. (Singapore)
Kemao Qian, Nanyang Technological Univ. (Singapore)
Anand Asundi, Nanyang Technological Univ. (Singapore)

Published in SPIE Proceedings Vol. 7851:
Information Optics and Optical Data Storage
Feijun Song; Shiquan Tao; Francis T. S. Yu; Suganda Jutamulia; Kees A. Schouhamer Immink; Keiji Shono, Editor(s)

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