Share Email Print

Proceedings Paper

Characterization of a generalized elliptical phase retarder by using equivalent theorem of a linear phase retarder and a polarization rotator
Author(s): Chih-Jen Yu; Chien Chou
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

An equivalence theory based on a unitary optical system of a generalized elliptical phase retarder was derived. Whereas the elliptical phase retarder can be treated as the combination of a linear phase retarder and a polarization rotator equivalently. Three fundamental parameters, including the elliptical phase retardation, the azimuth angle and the ellipticity angle of the fast elliptical eigen-polarization state were derived. All parameters of a generalized elliptical phase retarder can be determined from the analytical solution of the characteristic parameters of the optical components: linear phase retardation and fast axis angle of the equivalently linear phase retarder respectively, and polarization rotation angle of an equivalent polarization rotator. In this study, the experimental verification was demonstrated by testing a twisted nematic liquid crystal device (TNLCD) treated as a generalized elliptical phase retarder. A dual-frequency heterodyne ellipsometer was setup and the experimental result demonstrates the capability of the equivalent theory on elliptical birefringence measurement at high sensitivity by using heterodyne technique.

Paper Details

Date Published: 23 February 2011
PDF: 7 pages
Proc. SPIE 7934, Optical Components and Materials VIII, 79341F (23 February 2011); doi: 10.1117/12.875047
Show Author Affiliations
Chih-Jen Yu, Chang Gung Univ. (Taiwan)
Chien Chou, Chang Gung Univ. (Taiwan)

Published in SPIE Proceedings Vol. 7934:
Optical Components and Materials VIII
Michel J. F. Digonnet; Shibin Jiang; John W. Glesener; J. Christopher Dries, Editor(s)

© SPIE. Terms of Use
Back to Top