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Proceedings Paper

Size dependent surface energy of silicon nanoclusters in SiO2 determined from the thermal evolution of their size distribution using a combination of X-TEM and Raman
Author(s): Iain F. Crowe; Oksana Hulko; Andrew P. Knights; Matthew P. Halsall; Russell M. Gwilliam
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Proc. SPIE 7947, Quantum Dots and Nanostructures: Synthesis, Characterization, and Modeling VIII, 79470V; doi: 10.1117/12.874982
Show Author Affiliations
Iain F. Crowe, The Univ. of Manchester (United Kingdom)
Oksana Hulko, McMaster Univ. (Canada)
Andrew P. Knights, McMaster Univ. (Canada)
Matthew P. Halsall, The Univ. of Manchester (United Kingdom)
Russell M. Gwilliam, Univ. of Surrey (United Kingdom)


Published in SPIE Proceedings Vol. 7947:
Quantum Dots and Nanostructures: Synthesis, Characterization, and Modeling VIII
Kurt G. Eyink; Frank Szmulowicz; Diana L. Huffaker, Editor(s)

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