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Proceedings Paper

Novel display mode using waveguide and LC based light shutter
Author(s): Joon-young Yang; Jong-beom Lee; Jong-won Moon; Dong-ho Lee; Kyung-woon Lee; Chang-dong Kim; Yong-ki Hwang; In-Jae Chung; Jung-ho Park
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Paper Abstract

New conceptual display structure is introduced by using TIR characteristics and BPLC as alight shutter. In our structure, non-polarized light source can be used as incident light due to the isotropic characteristics of BPLC unlike previously suggested waveguide display concept using nematic LC at '0' bias voltage. In addition, light leakage in the case of BPLC is smaller than that in the case of nematic LC. According to the wave mode, TM mode or TE mode, the critical angle is different from each other due to homeotropical characteristics of BPLC at bias voltage. Then, each critical angle is measured and optoelectronic characteristics of BPLC are estimated with increasing applied voltage. In addition, the intensity characteristics according to bias voltage across BPLC are studied with various waves. We confirm the nonpolarized light source can be automatically filtered, and directly used for waveguide display by BPLC. Consequently, BPLC can be nominated as a new light shutter in waveguide display structure using TIR mechanism.

Paper Details

Date Published: 2 February 2011
PDF: 9 pages
Proc. SPIE 7956, Advances in Display Technologies; and E-papers and Flexible Displays, 79560O (2 February 2011); doi: 10.1117/12.874638
Show Author Affiliations
Joon-young Yang, LG Display (Korea, Republic of)
Jong-beom Lee, LG Display (Korea, Republic of)
Jong-won Moon, LG Display (Korea, Republic of)
Dong-ho Lee, Korea Univ. (Korea, Republic of)
Kyung-woon Lee, Korea Univ. (Korea, Republic of)
Chang-dong Kim, LG Display (Korea, Republic of)
Yong-ki Hwang, LG Display (Korea, Republic of)
In-Jae Chung, LG Display (Korea, Republic of)
Jung-ho Park, Korea Univ. (Korea, Republic of)


Published in SPIE Proceedings Vol. 7956:
Advances in Display Technologies; and E-papers and Flexible Displays
Karlheinz Blankenbach; Liang-Chy Chien; Sin-Doo Lee; Ming Hsien Wu, Editor(s)

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