Share Email Print
cover

Proceedings Paper

Comparison of resolution in tomographic diffractive microscopy using combinations of sample rotation and illumination rotation
Author(s): Stanislas Vertu; Etsuo Maeda; Jens Flügge; Jean-Jacques Delaunay; Olivier Haeberlé
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Tomographic Diffractive Microscopy (TDM) is a technique, which permits to image transparent living specimens without staining. For weakly diffractive samples, the three-dimensional distribution of the complex Refractive Index (RI) can be reconstructed from the knowledge of the measured scattered fields sampled under various viewing and illumination angles, according to the diffraction tomography theorem. TDM is commonly implemented in two ways, by either rotating the sample illumination keeping the specimen fixed, or by rotating the sample using fixed illumination. Both methods present limitations. Under the first-order Born approximation, the varying illumination direction method presents a strong anisotropic resolution along the optical axis due to the so-called "missing cone" of non captured frequencies. The sample rotation method presents a better isotropic resolution, but with a reduced extension of the captured frequencies. In view of overcoming the limitations of each method, we have studied various techniques for expanding the Optical Transfer Function with a tomographic microscope by combining different configurations of the sample rotation method with the varying illumination direction method, in order to obtain a high and isotropic resolution. Using simulations, we investigate the performances of the different configurations we propose.

Paper Details

Date Published: 23 February 2011
PDF: 6 pages
Proc. SPIE 7904, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XVIII, 79041O (23 February 2011); doi: 10.1117/12.874446
Show Author Affiliations
Stanislas Vertu, Physikalisch-Technische Bundesanstalt (Germany)
Etsuo Maeda, The Univ. of Tokyo (Japan)
Jens Flügge, Physikalisch-Technische Bundesanstalt (Germany)
Jean-Jacques Delaunay, The Univ. of Tokyo (Japan)
Olivier Haeberlé, Univ. of Haute Alsace (France)


Published in SPIE Proceedings Vol. 7904:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XVIII
Jose-Angel Conchello; Carol J. Cogswell; Tony Wilson; Thomas G. Brown, Editor(s)

© SPIE. Terms of Use
Back to Top