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Proceedings Paper

Defect mediated detection of wavelengths around 1550 nm in a ring resonant structure
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Paper Abstract

In this paper we outline recent results which combine defect mediated Photo-Detectors (PDs) in a Ring Resonator (RR) structure. By exploiting the multiple-pass of the optical signal through the detector, we are able to significantly decrease the size of the detector structure while maintaining good responsivity (typically 0.1 A/W). In such a geometry the detector bandwidth is not capacitance limited, while the leakage current is reduced toward 1 nA. We also show that these PDs may be used in the drop port of a RR to monitor the propagating signal. These devices have applicability in multiplexing and potential for integration with high speed modulation functionality.

Paper Details

Date Published: 17 January 2011
PDF: 7 pages
Proc. SPIE 7943, Silicon Photonics VI, 794308 (17 January 2011); doi: 10.1117/12.874018
Show Author Affiliations
A. P. Knights, McMaster Univ. (Canada)
J. K. Doylend, McMaster Univ. (Canada)
D. F. Logan, McMaster Univ. (Canada)
J. J. Ackert, McMaster Univ. (Canada)
P. E. Jessop, Wilfrid Laurier Univ. (Canada)
P. Velha, Univ. of Glasgow (United Kingdom)
M. Sorel, Univ. of Glasgow (United Kingdom)
R. M. De La Rue, Univ. of Glasgow (United Kingdom)

Published in SPIE Proceedings Vol. 7943:
Silicon Photonics VI
Joel A. Kubby; Graham T. Reed, Editor(s)

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