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Proceedings Paper

Dielectric analysis on optical properties of ZrO2 thin films dispersed with silver nanoparticles prepared by sol-gel method
Author(s): Moriaki Wakaki; Eisuke Yokoyama
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Paper Abstract

Nanoparticles of noble metals exhibit variety of colors in the visible wavelength region due to the surface plasmon resonance. The size-induced properties of nanoparticles offer the flexibility in material design to conventional material systems for a variety of fields. In many composite materials, the aim is to design a material with desired electrical and optical properties. The dielectric properties of nanocomposites can be calculated by an effective medium approximation (EMA). Maxwell-Garnett (M-G) and Bruggeman models are well known mixing rules in EMA. In the M-G model, the available region is restricted to relatively small volume fraction of the inclusions because of the assumptions imposed on the model. For large volume fraction of the inclusions and for randomly intermixed constituents, Bruggeman derived EMA by considering the host material as an effective medium. The aim of this study is to examine the applicability of the effective medium theory to the synthesized ZrO2-Ag compsite materials. The silver nanoparticle/ZrO2 thin film composites were prepared by the sol-gel method with various silver fill fractions. The films were analyzed by a UV-Vis- NIR spectrophotometer, a transmission electron microscope and an X-ray diffractometer. The absorption due to the silver surface plasmon resonance was simulated using the dielectric function reflecting the M-G and the Bruggeman mixture rules. It was found the applicability of M-G model is limited to smaller densities than 50 mol% and that of the Bruggeman model is over 70 mol% of silver density in this composite system.

Paper Details

Date Published: 23 February 2011
PDF: 7 pages
Proc. SPIE 7934, Optical Components and Materials VIII, 793411 (23 February 2011); doi: 10.1117/12.873259
Show Author Affiliations
Moriaki Wakaki, Tokai Univ. (Japan)
Eisuke Yokoyama, Tokai Univ. (Japan)

Published in SPIE Proceedings Vol. 7934:
Optical Components and Materials VIII
Michel J. F. Digonnet; Shibin Jiang; John W. Glesener; J. Christopher Dries, Editor(s)

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