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Proceedings Paper

Variable angle total internal reflection fluorescence microscopy in s-polarization: a new approach to quantify cell-substrate distances in contacts
Author(s): Abdollah Hassanzadeh; Ata Bahmani; Silvia Mittler
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Paper Abstract

Total internal reflection fluorescence microscopy is an evanescent based fluorescence microscope providing a selective visualization of cell-substrate contacts without interference from other, deeper cellular regions. Total internal reflection fluorescence microscope is used extensively to visualize cell-substrate contacts. However, quantifying these contacts - in particular the measurement of cell-substrate distances - has not been performed often. In order to quantify the cellsubstrate distances we have developed a new theoretical method which is based on a change in the penetration depth of the evanescent field by tuning the angle of incidence slightly above the angle of total internal reflection for s-polarized light. This is simpler and much more accurate in comparison to the few existing approaches.

Paper Details

Date Published: 21 September 2010
PDF: 6 pages
Proc. SPIE 7750, Photonics North 2010, 77500F (21 September 2010); doi: 10.1117/12.872938
Show Author Affiliations
Abdollah Hassanzadeh, Univ. of Kurdistan (Iran, Islamic Republic of)
Ata Bahmani, Univ. of Kurdistan (Iran, Islamic Republic of)
Silvia Mittler, The Univ. of Western Ontario (Canada)

Published in SPIE Proceedings Vol. 7750:
Photonics North 2010
Henry P. Schriemer; Rafael N. Kleiman, Editor(s)

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