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Proceedings Paper

Optimal design and critical analysis of a high resolution video plenoptic demonstrator
Author(s): Valter Drazic; Jean-Jacques Sacré; Jérôme Bertrand; Arno Schubert; Etienne Blondé
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Paper Abstract

A plenoptic camera is a natural multi-view acquisition device also capable of measuring distances by correlating a set of images acquired under different parallaxes. Its single lens and single sensor architecture have two downsides: limited resolution and depth sensitivity. In a very first step and in order to circumvent those shortcomings, we have investigated how the basic design parameters of a plenoptic camera optimize both the resolution of each view and also its depth measuring capability. In a second step, we built a prototype based on a very high resolution Red One® movie camera with an external plenoptic adapter and a relay lens. The prototype delivered 5 video views of 820x410. The main limitation in our prototype is view cross talk due to optical aberrations which reduce the depth accuracy performance. We have simulated some limiting optical aberrations and predicted its impact on the performances of the camera. In addition, we developed adjustment protocols based on a simple pattern and analyzing programs which investigate the view mapping and amount of parallax crosstalk on the sensor on a pixel basis. The results of these developments enabled us to adjust the lenslet array with a sub micrometer precision and to mark the pixels of the sensor where the views do not register properly.

Paper Details

Date Published: 15 February 2011
PDF: 13 pages
Proc. SPIE 7863, Stereoscopic Displays and Applications XXII, 786318 (15 February 2011); doi: 10.1117/12.872852
Show Author Affiliations
Valter Drazic, Technicolor S.A. (France)
Jean-Jacques Sacré, Technicolor S.A. (France)
Jérôme Bertrand, Technicolor S.A. (France)
Arno Schubert, Technicolor S.A. (France)
Etienne Blondé, Technicolor S.A. (France)

Published in SPIE Proceedings Vol. 7863:
Stereoscopic Displays and Applications XXII
Andrew J. Woods; Nicolas S. Holliman; Neil A. Dodgson, Editor(s)

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