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Proceedings Paper

An innovative approach in structured light systems
Author(s): H. Yousef; R. Huez; L. Hussenet; M. Herbin
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Paper Abstract

This paper presents an integrated 3D face scanning system using the structured light technique. After illuminating the face by a pattern with horizontal colored strips using the De_Bruijn sequence, an image is taken and used to obtain the 3D information. A second image without illumination is used to add the texture to the reconstructed model. The precision of the 3D model depends on the determination of the strip centers. The technique proposed to determine these centers uses a smoothing Gaussian filter with a large kernel applied to the V component in the HSV color space. A classic connection algorithm allows to link the isolated points in the detected strips. The color of the detected strips is determined for the whole connected parts in two steps. Firstly, we use the H component of the HSV color space to determine the color of each set of pixels. Then, we apply a region growing algorithm to assign the colors to the remaining pixels. Each connected and colored part of line is treated alone and matched to a line in the projected pattern. Finally each detected point is triangulated with its corresponding one in the projected pattern to generate the model. Experiment results show a good 3D resolution with this technique.

Paper Details

Date Published: 27 January 2011
PDF: 8 pages
Proc. SPIE 7864, Three-Dimensional Imaging, Interaction, and Measurement, 78640N (27 January 2011); doi: 10.1117/12.872394
Show Author Affiliations
H. Yousef, IUT Reims Châlons Charleville (France)
Univ. de Reims Champagne-Ardenne (France)
R. Huez, IUT Reims Châlons Charleville (France)
Univ. de Reims Champagne-Ardenne (France)
L. Hussenet, IUT Reims Châlons Charleville (France)
Univ. de Reims Champagne-Ardenne (France)
M. Herbin, IUT Reims Châlons Charleville (France)
Univ. de Reims Champagne-Ardenne (France)

Published in SPIE Proceedings Vol. 7864:
Three-Dimensional Imaging, Interaction, and Measurement
J. Angelo Beraldin; Ian E. McDowall; Atilla M. Baskurt; Margaret Dolinsky; Geraldine S. Cheok; Michael B. McCarthy; Ulrich Neuschaefer-Rube, Editor(s)

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