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Proceedings Paper

Research on the surface reflectance measurement of optical element with transparent substrate
Author(s): Guo Xia; Xingzhi Gong; Liang Cheng; Feihong Yu
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Paper Abstract

Because of the substrate back reflectance phenomena, the reflectance of optical elements on a transparent substrate is totally different from that of on an opaque substrate. In this paper, the differences between normal and quasi-normal substrate back reflectance are analyzed for the first time. Then a detailed study of the influences of the substrate thickness, substrate material, measuring distance and other parameters in the measurement are performed, the computational expressions of fitting surface reflectance are derived, and a compensation model of the substrate back reflectance measurement is proposed. Simulation and experimental results prove the correctness of the theoretical model and show this compensation model can be used in the substrate back reflectance measurement.

Paper Details

Date Published: 9 November 2010
PDF: 7 pages
Proc. SPIE 7849, Optical Design and Testing IV, 78492V (9 November 2010); doi: 10.1117/12.871620
Show Author Affiliations
Guo Xia, Zhejiang Univ. (China)
Xingzhi Gong, Zhejiang Univ. (China)
Liang Cheng, Zhejiang Univ. (China)
Feihong Yu, Zhejiang Univ. (China)

Published in SPIE Proceedings Vol. 7849:
Optical Design and Testing IV
Yongtian Wang; Julie Bentley; Chunlei Du; Kimio Tatsuno; Hendrik P. Urbach, Editor(s)

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