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Proceedings Paper

Reliability evaluation on 100W QCW-AlGaAs/GaAs 808nm cm-bars
Author(s): Guoguang Lu; Yun Huang; Yungfei En
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Paper Abstract

Degradation performance and lifetimes of high power laser diodes are important issues for laser manufacturers and end users. To fully understand these issues we have set up a computer controlled diode array reliability experiment which can automated monitor the laser bars 24 hours a day. Subsequent two different temperatures aging tests were completed, according to the aging results we obtained an acceleration factor 1.88 of resulting in a thermal activation energy of Ea=0.21eV. Finally, the detailed failure analysis for the failed devices and its influence on reliability were reported on this paper.

Paper Details

Date Published: 21 July 2010
PDF: 9 pages
Proc. SPIE 7749, 2010 International Conference on Display and Photonics, 77490W (21 July 2010); doi: 10.1117/12.871540
Show Author Affiliations
Guoguang Lu, China CEPREI Labs. (China)
Yun Huang, China CEPREI Labs. (China)
Yungfei En, China CEPREI Labs. (China)


Published in SPIE Proceedings Vol. 7749:
2010 International Conference on Display and Photonics

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