Share Email Print
cover

Proceedings Paper

Quasi-ballistic thermal transport from nanoscale interfaces observed using ultrafast coherent soft x-ray beams
Author(s): Mark E. Siemens; Qing Li; Ronggui Yang; Keith A. Nelson; Erik H. Anderson; Margaret M. Murnane; Henry C. Kapteyn
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Heat dissipation from a nanoscale hot-spot is expected to be non-diffusive when a hot-spot is smaller than the phonon mean free path of the substrate. Our technique of observing diffraction of coherent soft x-ray pulses allows for very high resolution (~pm) of thermally-induced surface distortion, as well as femtosecond time resolution of dynamics. We successfully model our experimental results with a diffusive transport model that is modified to include an additional boundary resistance. These results confirm the importance of considering ballistic transport away from a nanoscale heat source, and identify a means of correctly accounting for this ballistic transport.

Paper Details

Date Published: 21 February 2011
PDF: 5 pages
Proc. SPIE 7937, Ultrafast Phenomena in Semiconductors and Nanostructure Materials XV, 793716 (21 February 2011); doi: 10.1117/12.871455
Show Author Affiliations
Mark E. Siemens, Univ. of Denver (United States)
Univ. of Colorado at Boulder (United States)
Qing Li, Univ. of Colorado at Boulder (United States)
Ronggui Yang, Univ. of Colorado at Boulder (United States)
Keith A. Nelson, Massachusetts Institute of Technology (United States)
Erik H. Anderson, Lawrence Berkeley National Lab. (United States)
Margaret M. Murnane, Univ. of Colorado at Boulder (United States)
Henry C. Kapteyn, Univ. of Colorado at Boulder (United States)


Published in SPIE Proceedings Vol. 7937:
Ultrafast Phenomena in Semiconductors and Nanostructure Materials XV
Kong-Thon Tsen; Jin-Joo Song; Markus Betz; Abdulhakem Y. Elezzabi, Editor(s)

© SPIE. Terms of Use
Back to Top