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Proceedings Paper

An image quality evaluation tool simulating image sensors including quantum efficiency off-axis effect
Author(s): Clémence Mornet; Jérôme Vaillant; Thomas Decroux; Nicolas Virollet; Didier Herault; Isabelle Schanen
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Paper Abstract

The image quality evaluation of CMOS sensors is a big challenge for camera module manufacturers. In this paper, we present an update of the Image Quality Evaluation Tool, a graphical user interface simulating image sensors to assess the performance of a pixel. The simulated images are computed from operating conditions and sensor's characteristics like Quantum Efficiency including off-axis effect. Simulation of QE off-axis impact has been based on characterization data. The method does not require optics, making it suitable for early design phases as for optimizations and investigations. Both measurement and implementation in the tool will be explained. The QE degradation with angle effect will be highlighted on simulated images. A uniform gray scene or coloured image simulation from QE off-axis measurement will help engineers to calculate post-processing digital correction like colour shading correction or colour correction matrix versus pixel position.

Paper Details

Date Published: 24 January 2011
PDF: 13 pages
Proc. SPIE 7876, Digital Photography VII, 78760M (24 January 2011); doi: 10.1117/12.871344
Show Author Affiliations
Clémence Mornet, STMicroelectronics (France)
Institut de Microélectronique Électromagnétisme et Photonique (France)
Jérôme Vaillant, STMicroelectronics (France)
Thomas Decroux, STMicroelectronics (France)
Nicolas Virollet, STMicroelectronics (France)
Didier Herault, STMicroelectronics (France)
Isabelle Schanen, Institut de Microélectronique Électromagnétisme et Photonique (France)

Published in SPIE Proceedings Vol. 7876:
Digital Photography VII
Francisco H. Imai; Feng Xiao, Editor(s)

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