Share Email Print

Proceedings Paper

Lens solutions which increase manufacturing yield
Author(s): Stan Szapiel; Catherine Greenhalgh
Format Member Price Non-Member Price
PDF $17.00 $21.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The classic method of design centering commonly used to increase the yield of electronic circuits is employed to improve manufacturability of complex lens designs. The approach uses the results of Monte Carlo (MC) statistics to iteratively center the nominal design on a new point that shows an improved yield. Rather than just employing the MC lens run for routine as-built performance forecast, the results of the simulation are re-used to find the changes in the nominal design parameters values which will increase the yield. The centers-of-gravity (COG) algorithm is selected as a quick and easy method of shifting the nominal design point in the multidimensional parameter space to the new location. The classic COG algorithm is modified to avoid situations when the position of either "pass" or "fail" center of gravity is difficult to determine. Examples of application, which include a wide-angle IR lens and a plan-apochromat objective for a digital microscope show that such method of lens design centering is promising, and even a single iteration may result in significantly improved yield.

Paper Details

Date Published: 9 September 2010
PDF: 9 pages
Proc. SPIE 7652, International Optical Design Conference 2010, 76521L (9 September 2010); doi: 10.1117/12.870999
Show Author Affiliations
Stan Szapiel, Raytheon ELCAN Optical Technologies (Canada)
Catherine Greenhalgh, Raytheon ELCAN Optical Technologies (Canada)

Published in SPIE Proceedings Vol. 7652:
International Optical Design Conference 2010
Julie Bentley; Anurag Gupta; Richard N. Youngworth, Editor(s)

© SPIE. Terms of Use
Back to Top