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Proceedings Paper

Sensitivities of the spatial-resolved diffuse reflectance to scattering parameters
Author(s): Xiao-juan Zhang; Wei Yang; Ying Liu
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Paper Abstract

The sensitivity expressions of spatial-resolved diffuse reflectance to first-order, second-order and third-order scattering parameter are derived in the P3 approximation of transport theory. The influence of first-order scattering parameter on the P3 approximation and diffusion approximation reflectance are compared, it is demonstrated that the sensitivity is distinct with that of the diffusion approximation in the region of about two transport mean free paths. The numerical analysis of second-order and third-order scattering parameter sensitivity expressions are also done. It is found that the sensitivities change with source-detector separations and reach a maximum in the region of between one transport mean free path and two transport mean free paths, and are positive in the region of beyond one transport mean free path. The influence of third-order optical parameter on the diffusing reflectance can be ignored by compared with the influence of second-order optical parameter.

Paper Details

Date Published: 8 November 2010
PDF: 8 pages
Proc. SPIE 7845, Optics in Health Care and Biomedical Optics IV, 78452R (8 November 2010); doi: 10.1117/12.870927
Show Author Affiliations
Xiao-juan Zhang, Civil Aviation Univ. of China (China)
Wei Yang, Civil Aviation Univ. of China (China)
Ying Liu, Tianjin Univ. (China)

Published in SPIE Proceedings Vol. 7845:
Optics in Health Care and Biomedical Optics IV
Qingming Luo; Ying Gu; Xingde Li, Editor(s)

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