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Proceedings Paper

Correlation between the optical pickup electrical evaluator and spot analyzer considering the focus spot characteristics
Author(s): Xuemin Cheng; Jianshe Ma; Yingchao Cui; Dexi Wang; Zhiqing Zhang; Hanzhong Liao
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Paper Abstract

The optical pickup unit is a kind of mass-produced product as well as a diffraction-limited micro-optical system. Thus the optical elements are assembled serially in the production line, and its fabricating and assembling errors should be controlled to achieve a diffraction-limited focus spot on the disk. And the reflected light from the disk on the photo detector would be converted and processed in the servo control system and evaluated using the electrical evaluator. Thus a correlation between the electrical evaluator and the spot intensity should be considered when setting the testing standard for a production line. In this paper, the optical pickup is measured using a spot analyzing system. Its electrical signals are described in the evaluator. The optical system in the optical pickup would be divided into two testing parts: base part and focusing part. The base part includes the laser diode, collimator, prism, quarter-wave-plate, beam splitter and reflective mirror; while the focusing part has objective lens, phase plate, wave-plate, and so on. The focus quality is measured using the spot analyzer. Then these optical pickups are processed to get the electrical signals directly from the evaluator. Finally the parameters achieved using these two systems are compared and its correlation are investigated. This method is verified when designing a DVD production line and might be useful in establishing the standards for a new optical pickup.

Paper Details

Date Published: 2 December 2010
PDF: 6 pages
Proc. SPIE 7851, Information Optics and Optical Data Storage, 78511A (2 December 2010); doi: 10.1117/12.870691
Show Author Affiliations
Xuemin Cheng, Tsinghua Univ. (China)
Jianshe Ma, Tsinghua Univ. (China)
Yingchao Cui, Tsinghua Univ. (China)
Dexi Wang, Tsinghua Univ. (China)
Zhiqing Zhang, Tsinghua Univ. (China)
Hanzhong Liao, Tsinghua Univ. (China)


Published in SPIE Proceedings Vol. 7851:
Information Optics and Optical Data Storage
Feijun Song; Shiquan Tao; Francis T. S. Yu; Suganda Jutamulia; Kees A. Schouhamer Immink; Keiji Shono, Editor(s)

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