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Proceedings Paper

Vibration phase measurements using holographic optical elements based electronic speckle pattern interferometry
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Paper Abstract

The application of an out-of-plane sensitive electronic speckle pattern interferometer (ESPI) using holographic optical element (HOE) to vibration amplitude and phase mapping is reported. The novelty of the proposed system is the use of a speckle reference wave stored in a reflection holographic optical element (HOE). The incorporation of a HOE minimizes the alignment difficulties. The HOE based ESPI system is compact containing only a diode laser, HOE and a digital CMOS camera. The measurement technique is a combination of time averaged ESPI and reference beam phase modulation in an unbalanced interferometer. The reference beam phase modulation is implemented by modulating the drive current of the diode laser. The presented HOE based ESPI system is easy to align and compact and thus suitable for industrial non-destructive testing and vibration analysis.

Paper Details

Date Published: 13 September 2010
PDF: 8 pages
Proc. SPIE 7387, Speckle 2010: Optical Metrology, 73870E (13 September 2010); doi: 10.1117/12.870583
Show Author Affiliations
Viswanath Bavigadda, Dublin Institute of Technology (Ireland)
Raghavendra Jallapuram, Dublin Institute of Technology (Ireland)
Vincent Toal, Dublin Institute of Technology (Ireland)
Emilia Mihaylova, Dublin Institute of Technology (Ireland)

Published in SPIE Proceedings Vol. 7387:
Speckle 2010: Optical Metrology
Armando Albertazzi Goncalves Jr.; Guillermo H. Kaufmann, Editor(s)

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