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Proceedings Paper

A sub-aperture scanning method for detecting wavefront of long-focus lens
Author(s): Yao Li; Jing Wang; Changlun Hou; Jian Bai
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Paper Abstract

To detect the wavefront of a long-focus lens, a new method is proposed in this paper. It is based on two dimensional sub-aperture scanning and model method reconstruction. The number of stripes moved from one sub-aperture to another has a relationship with the wavefront slope. In most cases it can be approached to linear relation. Through scanning the initial wavefront slope data are achieved. Then with the slope data, the wavefront is reconstructed by model method with Zernike polynomials. Singular value decomposition method is used in the process of solving the matrix equation. Stripe-counting is one of the most important contents, which plays a decisive role in getting an accurate experimental result. The method's precision is validated after comparing it with laser interferometer. It also works in some situations that interferometer will not be suitable to detect a long-focus and large-diameter lens.

Paper Details

Date Published: 9 November 2010
PDF: 7 pages
Proc. SPIE 7849, Optical Design and Testing IV, 78492P (9 November 2010); doi: 10.1117/12.870537
Show Author Affiliations
Yao Li, Zhejiang Univ. (China)
Jing Wang, Zhejiang Univ. (China)
Changlun Hou, Zhejiang Univ. (China)
Jian Bai, Zhejiang Univ. (China)


Published in SPIE Proceedings Vol. 7849:
Optical Design and Testing IV
Yongtian Wang; Julie Bentley; Chunlei Du; Kimio Tatsuno; Hendrik P. Urbach, Editor(s)

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