Share Email Print
cover

Proceedings Paper

High transmittance and wide pass-band filter based on a three-layer structure of metal-dielectric-metal hole arrays
Author(s): Lei Rao; Dongxiao Yang; Le Zhang; Tao Li; Xiang Liu
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

In this paper, square lattices of air holes were fabricated on a three-layer structure of metal-dielectric-metal using micromachining technology. The metal-dielectric-metal structure is based on RT/duroid 5870 produced by Rogers corporation. The square period is 400 μm and the radius of circular hole is 100 μm. The thickness of the structure is about 863 μm with metal thickness of 39.2 μm and dielectric layer thickness of 785 μm. The loss and dispersion of the dielectric layer with the dielectric constant of 2.33 are low at microwave frequencies. Terahertz transmission spectra through the sample were measured by the state-of-the-art THz-TDS system. Experimental results show that there is a transmittance centered at 1 THz with a wide pass-band exceeding 100 GHz. Transmission spectra calculated by FDTD method were given for comparisons and showed good agreements with the experimental results. Through analysis, the extraordinary transmission phenomena are caused by both the Febry-Parot effect and surface plasmon polaritons existing on the metal arrays.

Paper Details

Date Published: 4 November 2010
PDF: 7 pages
Proc. SPIE 7854, Infrared, Millimeter Wave, and Terahertz Technologies, 78540L (4 November 2010); doi: 10.1117/12.870528
Show Author Affiliations
Lei Rao, Zhejiang Univ. (China)
Dongxiao Yang, Zhejiang Univ. (China)
Le Zhang, Zhejiang Univ. (China)
Tao Li, Zhejiang Univ. (China)
Xiang Liu, Zhejiang Univ. (China)


Published in SPIE Proceedings Vol. 7854:
Infrared, Millimeter Wave, and Terahertz Technologies
Cunlin Zhang; Xi-Cheng Zhang; Peter H. Siegel; Li He; Sheng-Cai Shi, Editor(s)

© SPIE. Terms of Use
Back to Top