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Proceedings Paper

Extraction and analysis of the image in the sight field of comparison goniometer to measure IR mirrors assembly
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Paper Abstract

The comparison goniometer is widely used to measure and inspect small angle, angle difference, and parallelism of two surfaces. However, the common manner to read a comparison goniometer is to inspect the ocular of the goniometer by one eye of the operator. To read an old goniometer that just equips with one adjustable ocular is a difficult work. In the fabrication of an IR reflecting mirrors assembly, a common comparison goniometer is used to measure the angle errors between two neighbor assembled mirrors. In this paper, a quick reading technique image-based for the comparison goniometer used to inspect the parallelism of mirrors in a mirrors assembly is proposed. One digital camera, one comparison goniometer and one set of computer are used to construct a reading system, the image of the sight field in the comparison goniometer will be extracted and recognized to get the angle positions of the reflection surfaces to be measured. In order to obtain the interval distance between the scale lines, a particular technique, left peak first method, based on the local peak values of intensity in the true color image is proposed. A program written in VC++6.0 has been developed to perform the color digital image processing.

Paper Details

Date Published: 5 November 2010
PDF: 7 pages
Proc. SPIE 7849, Optical Design and Testing IV, 78490J (5 November 2010); doi: 10.1117/12.870454
Show Author Affiliations
Zhi-shan Wang, Beijing Institute of Technology (China)
Henan Univ. of Technology (China)
Yue-jin Zhao, Beijing Institute of Technology (China)
Zhuo Li, Beijing Institute of Technology (China)
Liquan Dong, Beijing Institute of Technology (China)
Xuhong Chu, Beijing Institute of Technology (China)
Ping Li, Beijing Institute of Technology (China)

Published in SPIE Proceedings Vol. 7849:
Optical Design and Testing IV
Yongtian Wang; Julie Bentley; Chunlei Du; Kimio Tatsuno; Hendrik P. Urbach, Editor(s)

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