Share Email Print
cover

Proceedings Paper

The research of on-line inspection method of printed matter based on optical information processing
Author(s): Jia Wang
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Two on-line inspection methods of printed matter based on optical image subtraction are proposed, using two kinds of spatial light modulation (SLM) respectively, which are TFT-LCD and CRT-LCLV. The test image of printed matter is obtained by CCD, while the standard image of printed matter is saved in computer. The test image and standard image are jointly displayed on SLM by computer as the input image of an optical image subtraction system, which is an optical 4f system with a sine-grating between two lenses. The subtraction image will occur at the output plane, which contain all defects of the test image. Comparing to machine vision method, this inspection method of printed matter based on optical image subtraction is advantaged because the inspection process is accomplished by the optical system, avoiding any complicated arithmetic. The precision of printed matter inspection is defined by the frequency of SLM and the sine-grating. The relationship between parameters of the subtraction image and parameters of optical system is analyzed.

Paper Details

Date Published: 11 November 2010
PDF: 6 pages
Proc. SPIE 7855, Optical Metrology and Inspection for Industrial Applications, 78551T (11 November 2010); doi: 10.1117/12.870231
Show Author Affiliations
Jia Wang, Beijing Institute of Graphic Communication (China)


Published in SPIE Proceedings Vol. 7855:
Optical Metrology and Inspection for Industrial Applications
Kevin Harding; Peisen S. Huang; Toru Yoshizawa, Editor(s)

© SPIE. Terms of Use
Back to Top