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Proceedings Paper

Continuous wave terahertz phase imaging
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Paper Abstract

Continues wave terahertz imaging has been used widely in the field of security inspection and nondestructive examination because of its simplicity and stability. In this presentation, we proposed an image method with continues wave terahertz interferometry to obtain the sample's phase information. In the experiment, a reference terahertz beam was added into the exiting continues wave terahertz imaging system to be a Michelson interferometer. With three maps obtained at three fixed phase-shift positions, a phase image is obtained by using a phase shift algorithm. Afterwards, this phase image is unwrapped to get its accurate phase profile. By this method, a bulk of foam with two height steps structure is imaged. The result shows that the inner structures of samples can be identified clearly and the relative optical depth profiles of samples can be obtained.

Paper Details

Date Published: 4 November 2010
PDF: 7 pages
Proc. SPIE 7854, Infrared, Millimeter Wave, and Terahertz Technologies, 78543A (4 November 2010); doi: 10.1117/12.870159
Show Author Affiliations
Wenfeng Sun, Beijing Key Lab. for Terahertz Spectroscopy and Imaging (China)
Key Lab. of Terahertz Optoelectronics (China)
Capital Normal Univ. (China)
Xinke Wang, Harbin Institute of Technology (China)
Ye Cui, Beijing Key Lab. for Terahertz Spectroscopy and Imaging (China)
Key Lab. of Terahertz Optoelectronics (China)
Capital Normal Univ. (China)
Yan Zhang, Beijing Key Lab. for Terahertz Spectroscopy and Imaging (China)
Key Lab. of Terahertz Optoelectronics (China)
Capital Normal Univ. (China)


Published in SPIE Proceedings Vol. 7854:
Infrared, Millimeter Wave, and Terahertz Technologies
Cunlin Zhang; Xi-Cheng Zhang; Peter H. Siegel; Li He; Sheng-Cai Shi, Editor(s)

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