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Proceedings Paper

Research on generated mechanism of scattering characteristic of random rough dielectric surface
Author(s): Jiang Shu; Jiancheng Lai; Chunyong Wang; Zhenhua Li; Baomin Bian; Jian Lu
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Paper Abstract

On the basis of electromagnetic theory, the scattering light intensity from a series of dielectric surfaces with different roughness is calculated by using monte-carlo method and the boundary condition of Kirchhoff approximation. The geometry profile of rough surfaces obeys Guass distribution and all of the surfaces have the same corelation length. With the increasing of rms height, the width of diffuse scattering intensity distribution, the attenuation of scattering peak value and its moving to the normal direction are observed. After theoretical analysis, it is obtained that the statistical distribution of the local slope varies with the rms height and reflecting index of these local slope are the main reasons for these phenomenon.

Paper Details

Date Published: 15 November 2010
PDF: 8 pages
Proc. SPIE 7854, Infrared, Millimeter Wave, and Terahertz Technologies, 78540T (15 November 2010); doi: 10.1117/12.870118
Show Author Affiliations
Jiang Shu, Nanjing Univ. of Science & Technology (China)
Jiancheng Lai, Nanjing Univ. of Science & Technology (China)
Chunyong Wang, Nanjing Univ. of Science & Technology (China)
Zhenhua Li, Nanjing Univ. of Science & Technology (China)
Baomin Bian, Nanjing Univ. of Science & Technology (China)
Jian Lu, Nanjing Univ. of Science & Technology (China)


Published in SPIE Proceedings Vol. 7854:
Infrared, Millimeter Wave, and Terahertz Technologies
Cunlin Zhang; Xi-Cheng Zhang; Peter H. Siegel; Li He; Sheng-Cai Shi, Editor(s)

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