Share Email Print

Proceedings Paper

Signal processing and correction implementation for modulation transfer function test bench
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The signal processing flow for the MTF test bench that is based on Fourier analysis method is presented. The signal processing flow mainly consists of three parts that are Fourier analyzing, background correction and system attenuation elimination. The center of the pinhole area is recognized automatically and the line spread functions (LSF) of both sagittal and tangential directions are calculated. Second-order fast Fourier transform is executed so that a primary two-direction MTF result is gained. Either auto Fourier-domain background correction or manual time-domain background correction is executed. The attenuation of the tested MTF result due to the influence of the detector and pinhole is eliminated finally. A commercially available 50-mm plano-convex audit lens is tested as the sample to validate the accuracy of the signal processing flow of the MTF test bench. The test error is below 0.01 under 200lp/mm.

Paper Details

Date Published: 9 November 2010
PDF: 6 pages
Proc. SPIE 7850, Optoelectronic Imaging and Multimedia Technology, 78501P (9 November 2010); doi: 10.1117/12.870058
Show Author Affiliations
Yuheng Chen, Soochow Univ. (China)
Xinhua Chen, Soochow Univ. (China)
Chunchang Xiang, Soochow Univ. (China)
Weimin Shen, Soochow Univ. (China)

Published in SPIE Proceedings Vol. 7850:
Optoelectronic Imaging and Multimedia Technology
Toru Yoshizawa; Ping Wei; Jesse Zheng; Tsutomu Shimura, Editor(s)

© SPIE. Terms of Use
Back to Top