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Proceedings Paper

Study of the metrological standard of tonometer and its testing method
Author(s): Fei Li; Jianping Zhu; Mingliang Gao; Xiang Ding
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Proc. SPIE 7855, Optical Metrology and Inspection for Industrial Applications, ; doi: 10.1117/12.869980
Show Author Affiliations
Fei Li, National Institute of Metrology (China)
Jianping Zhu, National Institute of Metrology (China)
Mingliang Gao, National Institute of Metrology (China)
Xiang Ding, National Institute of Metrology (China)


Published in SPIE Proceedings Vol. 7855:
Optical Metrology and Inspection for Industrial Applications
Kevin Harding; Peisen S. Huang; Toru Yoshizawa, Editor(s)

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