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Proceedings Paper

Thermal research of infrared sight thermoelectric cooler control circuit under temperature environment
Author(s): Youtang Gao; Huan Ding; Xiao Xue; Yuan Xu; Benkang Chang
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Paper Abstract

Testing device TST-05B, which is suitable for adaptability test of semiconductor devices, electronic products and other military equipment under the condition of the surrounding air temperature rapidly changing, is used here for temperature shock test.Thermal stability technology of thermoelectric cooler control circuit infrared sight under temperature shock is studied in this paper. Model parameters and geometry is configured for ADI devices (ADN8830), welding material and PCB which are used in system. Thermoelectric cooler control circuit packaged by CSP32 distribution are simulated and analyzed by thermal shock and waveform through engineering finite element analysis software ANSYYS. Because solders of the whole model have much stronger stress along X direction than that of other directions, initial stress constraints along X direction are primarily considered when the partial model of single solder is imposed by thermal load. When absolute thermal loads stresses of diagonal nodes with maximum strains are separated from the whole model, interpolation is processed according to thermal loads circulation. Plastic strains and thermal stresses of nodes in both sides of partial model are obtained. The analysis results indicates that with thermal load circulation, maximum forces of each circulation along X direction are increasingly enlarged and with the accumulation of plastic strains of danger point, at the same time structural deformation and the location of maximum equivalent plastic strain in the solder joints at the first and eighth, the composition will become invalid in the end.

Paper Details

Date Published: 17 November 2010
PDF: 8 pages
Proc. SPIE 7847, Optoelectronic Devices and Integration III, 78472C (17 November 2010); doi: 10.1117/12.869890
Show Author Affiliations
Youtang Gao, Nanyang Institute of Technology (China)
Nanjing Univ. of Science and Technology (China)
Huan Ding, Nanyang Institute of Technology (China)
Xiao Xue, Nanyang Institute of Technology (China)
Yuan Xu, Nanyang Institute of Technology (China)
Benkang Chang, Nanjing Univ. of Science and Technology (China)

Published in SPIE Proceedings Vol. 7847:
Optoelectronic Devices and Integration III
Xuping Zhang; Hai Ming; Alan Xiaolong Wang, Editor(s)

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