Share Email Print
cover

Proceedings Paper

Convergence study for lines, spaces between standard OPC, local, and more holistic OPC
Author(s): L. Perraud; Y. Trouiller; E. Yesilada; F. Robert; F. Foussadier; V. Farys; C. Gardin
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

As the OPC scripts become more and more complex for advanced technology nodes, the number of parameters used to control the convergence increases drastically. This paper does not aim to determine what a "good convergence criteria" is but rather to review the efficiency of the existing OPC solutions in terms of accuracy and parameter dependence, to solve simple design layouts. Three different OPC solutions, including a "standard algorithm", a "local convergence OPC" and a more holistic OPC, are compared on a design containing lines and line-ends. A cost function is used to determine the quality of the convergence for each type of structure. A map of convergence (iteration vs OPC Option) will be deduced for each structure.

Paper Details

Date Published: 8 April 2011
PDF: 8 pages
Proc. SPIE 7969, Extreme Ultraviolet (EUV) Lithography II, 79691P (8 April 2011); doi: 10.1117/12.869830
Show Author Affiliations
L. Perraud, Commissariat à l'Énergie Atomique (France)
STMicroelectronics (France)
Y. Trouiller, Commissariat à l'Énergie Atomique (France)
STMicroelectronics (France)
E. Yesilada, STMicroelectronics (France)
F. Robert, STMicroelectronics (France)
F. Foussadier, STMicroelectronics (France)
V. Farys, STMicroelectronics (France)
C. Gardin, STMicroelectronics (France)


Published in SPIE Proceedings Vol. 7969:
Extreme Ultraviolet (EUV) Lithography II
Bruno M. La Fontaine; Patrick P. Naulleau, Editor(s)

© SPIE. Terms of Use
Back to Top