Share Email Print

Proceedings Paper

Ultraviolet bidirectional reflectance distribution function measurement and analysis of typical roughness surface
Author(s): Lu Bai; Han-lu Zhang; Yun-hua Cao; Hai-ying Li; Zhen-sen Wu; Shi-mei Wang
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

An experiment measuring system is introduced. Angle-resolved single-band and multispectral bidirectional reflectance distribution function measurements are operated in ultraviolet band. Hemisphere spectral reflectivity of some samples is measured. An optimizing modeling method, particle swarm optimization (PSO) is used to model the laser BRDF data of typical samples. The results are fitted with the models developed above using optimize algorithm to get the parameters. Spectral BRDF of samples calculated with the model are in good agreement with the measured data. And these studies about measuring and optimizing modeling of typical roughness target samples in ultraviolet band have significant meanings in a lot of related fields.

Paper Details

Date Published: 11 November 2010
PDF: 7 pages
Proc. SPIE 7855, Optical Metrology and Inspection for Industrial Applications, 78551J (11 November 2010); doi: 10.1117/12.869722
Show Author Affiliations
Lu Bai, Xidian Univ. (China)
Han-lu Zhang, Xidian Univ. (China)
Yun-hua Cao, Xidian Univ. (China)
Hai-ying Li, Xidian Univ. (China)
Zhen-sen Wu, Xidian Univ. (China)
Shi-mei Wang, Anhui Institute of Optics and Fine Mechanics (China)

Published in SPIE Proceedings Vol. 7855:
Optical Metrology and Inspection for Industrial Applications
Kevin Harding; Peisen S. Huang; Toru Yoshizawa, Editor(s)

© SPIE. Terms of Use
Back to Top