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Proceedings Paper

A portable optical DSPI strain sensor with radial sensitivity using an axis-symmetrical DOE
Author(s): Matias R. Viotti; Walter A. Kapp; Armando Albertazzi Gonçalves
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Paper Abstract

This paper presents the optical setup of a radial in-plane digital speckle pattern interferometer (DSPI) which uses an axissymmetrical diffractive optical element to obtain double illumination. The application of the DOE gives true in-plane sensitivity that is independent on the wavelength of the laser used as illumination source. Furthermore, it only depends on the grating period of the DOE. A new optical layout was introduced in order to obtain a circular measurement area of about 5 mm in diameter. A brief description of the DOE and the portable strain sensor are presented. A detailed explanation of the clamping system is presented showing its ability to deal with rigid body displacements. Finally, some experimental results are shown enlightening that it is able to measure mechanical stress fields from only one difference phase map.

Paper Details

Date Published: 14 September 2010
PDF: 8 pages
Proc. SPIE 7387, Speckle 2010: Optical Metrology, 73870B (14 September 2010); doi: 10.1117/12.869665
Show Author Affiliations
Matias R. Viotti, LABMETRO, Univ. Federal de Santa Catarina (Brazil)
Walter A. Kapp, LABMETRO, Univ. Federal de Santa Catarina (Brazil)
Armando Albertazzi Gonçalves, LABMETRO, Univ. Federal de Santa Catarina (Brazil)


Published in SPIE Proceedings Vol. 7387:
Speckle 2010: Optical Metrology
Armando Albertazzi Goncalves; Guillermo H. Kaufmann, Editor(s)

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