Share Email Print
cover

Proceedings Paper

E-AERI calibration performance certification
Author(s): Robert Knuteson; Fred Best; Nicholas Ciganovich; Ray Garcia; Denny Hackel; Henry Revercomb; Joe Taylor; David Turner
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

The University of Wisconsin-Madison Space Science and Engineering Center (UW-SSEC) is certifying the calibration performance of a new generation of instruments for the measurement of the downwelling atmospheric infrared spectrum at the surface. The E-AERI instrument series is the commercial follow-on to the successful Atmospheric Emitted Radiance Interferometer (AERI) which was developed at UW-SSEC in the early 1990s with support from the U.S. Department of Energy Atmospheric Radiation Measurement (ARM) program. This paper describes the E-AERI instrument specification, the UW-SSEC certification methodology, and examples of preliminary of results obtained to date. The E-AERI instrument is a commercially available product of ABB/Bomem of Quebec, Canada using technology licensed by the UW-SSEC. The E-AERI meets the same specification as the original AERI instrument in a fully automated system for use in both research and operational profiling networks.

Paper Details

Date Published: 16 November 2010
PDF: 10 pages
Proc. SPIE 7857, Multispectral, Hyperspectral, and Ultraspectral Remote Sensing Technology, Techniques, and Applications III, 78571L (16 November 2010); doi: 10.1117/12.869593
Show Author Affiliations
Robert Knuteson, Univ. of Wisconsin-Madison (United States)
Fred Best, Univ. of Wisconsin-Madison (United States)
Nicholas Ciganovich, Univ. of Wisconsin-Madison (United States)
Ray Garcia, Univ. of Wisconsin-Madison (United States)
Denny Hackel, Univ. of Wisconsin-Madison (United States)
Henry Revercomb, Univ. of Wisconsin-Madison (United States)
Joe Taylor, Univ. of Wisconsin-Madison (United States)
David Turner, Univ. of Wisconsin-Madison (United States)


Published in SPIE Proceedings Vol. 7857:
Multispectral, Hyperspectral, and Ultraspectral Remote Sensing Technology, Techniques, and Applications III
Allen M. Larar; Hyo-Sang Chung; Makoto Suzuki, Editor(s)

© SPIE. Terms of Use
Back to Top