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Proceedings Paper

Distant field detecting oriented modeling method of material surface scattering characteristic
Author(s): Shixue Xu; Yanru Chen; Lingfei Xu; Jia Li; Feinan Chen; Jingjing Chen
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Paper Abstract

Different materials have different surface scattering characteristics some of which are quite different from each other. These characteristics can be detected, measured and then matched with models of surface scattering characteristics of known materials in order to achieve the differentiating of materials in a distant range. In distant field detecting, some information of the scattered light could not be detected precisely for the detecting range is too distant. Therefore, these kinds of scattered light information should be eliminated in distant field detecting oriented modeling of material surface scattering characteristics. In the other hand, those kinds of scattered light information should be maintained which has not been changed after long range spreading in order to make the model of scattering characteristic simple and easy to be applied. The measuring of two chosen typical materials indicates that the differences of polarization states of the scattered light from their surfaces are obvious. Further theoretical arithmetic indicates that these kinds of differences maintained their significance after the scattered light has been spread for a distant range.

Paper Details

Date Published: 22 July 2010
PDF: 4 pages
Proc. SPIE 7749, 2010 International Conference on Display and Photonics, 774921 (22 July 2010); doi: 10.1117/12.869467
Show Author Affiliations
Shixue Xu, Nanjing Univ. of Science and Technology (China)
Yanru Chen, Nanjing Univ. of Science and Technology (China)
Lingfei Xu, Nanjing Univ. of Science and Technology (China)
Jia Li, Nanjing Univ. of Science and Technology (China)
Feinan Chen, Nanjing Univ. of Science and Technology (China)
Jingjing Chen, Nanjing Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 7749:
2010 International Conference on Display and Photonics

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