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Proceedings Paper

Analysis methods for polarization state and energy transmission of rays propagating in optical systems
Author(s): Chao Liu; Qiangsheng Liu; Zhaofeng Cen; Xiaotong Li
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Paper Abstract

Polarization state of only completely polarized light can be analyzed by some software, ZEMAX for example. Based on principles of geometrical optics, novel descriptions of the light with different polarization state are provided in this paper. Differential calculus is well used for saving the polarization state and amplitudes of sampling rays when ray tracing. The polarization state changes are analyzed in terms of several typical circumstances, such as Brewster incidence, total reflection. Natural light and partially polarized light are discussed as an important aspect. Further more, a computing method including composition and decomposition of sampling rays at each surface is also set up to analyze the energy transmission of the rays for optical systems. Adopting these analysis methods mentioned, not only the polarization state changes of the incident rays can be obtained, but also the energy distributions can be calculated. Since the energy distributions are obtained, the surface with the most energy loss will be found in the optical system. The energy value and polarization state of light reaching the image surface will also be available. These analysis methods are very helpful for designing or analyzing optical systems, such as analyzing the energy of stray light in high power optical systems, researching the influences of optical surfaces to rays' polarization state in polarization imaging systems and so on.

Paper Details

Date Published: 5 November 2010
PDF: 7 pages
Proc. SPIE 7849, Optical Design and Testing IV, 78490G (5 November 2010); doi: 10.1117/12.869444
Show Author Affiliations
Chao Liu, Zhejiang Univ. (China)
Qiangsheng Liu, Zhejiang Univ. (China)
Zhaofeng Cen, Zhejiang Univ. (China)
Xiaotong Li, Zhejiang Univ. (China)

Published in SPIE Proceedings Vol. 7849:
Optical Design and Testing IV
Yongtian Wang; Julie Bentley; Chunlei Du; Kimio Tatsuno; Hendrik P. Urbach, Editor(s)

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