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Proceedings Paper

UV light source adaptive sensing technology for flue gas measurement
Author(s): Changku Sun; Chi Zhang; Bo Sun; Bin Liu; Peng Wang
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Paper Abstract

The UV absorption spectrometry technique DOAS (Differential Optical Absorption Spectroscopy) has been widely used in continuous monitoring of flue gas, and has achieved good results. DOAS method is based on the basic law of light absorption--Lambert-Beer law. SO2, NOX are the principal component of the flue gas. These components are considered by DOAS method at the same time. And certain mathematical methods are used for concentrations measuring. The Continuous Emission Monitoring System (CEMS) based on the principle of DOAS mainly has two probe-styles present: in-situ probe-style and extractive probe-style. For the in-situ probe-style CEMS based on DOAS method, prolonged use for the UV light source, contaminated lens caused by floating oil and complex environment of the flue will all bring attenuation of the spectral intensity, it will affect the accuracy of measurement. In this article, an in-situ continuous monitoring system based on DOAS method is described, and a component adaptive sensing technology is proposed. By using this adaptive sensing technology, CEMS can adjust the integral time of the spectrometer according to the non-measuring attenuation of the light source intensity and automatically compensate the loss of spectral intensity. Under the laboratory conditions, the experiments for SO2, NO standard gas measurement using adaptive sensing technology is made. Many different levels of light intensity attenuation are considered in the experiments. The results show that the adaptive sensing technology can well compensate the non-measuring loss of spectral intensity. In the field measurement, this technology can well reduce the measurement error brought by attenuation of light intensity, compared with the handheld gas analyzer, the average error of concentration measurement is less than 2% FS(Full Scale).

Paper Details

Date Published: 11 November 2010
PDF: 8 pages
Proc. SPIE 7855, Optical Metrology and Inspection for Industrial Applications, 78552A (11 November 2010); doi: 10.1117/12.868991
Show Author Affiliations
Changku Sun, Tianjin Univ. (China)
Chi Zhang, Tianjin Univ. (China)
Bo Sun, Tianjin Univ. (China)
Bin Liu, Tianjin Univ. (China)
Peng Wang, Tianjin Univ. (China)


Published in SPIE Proceedings Vol. 7855:
Optical Metrology and Inspection for Industrial Applications
Kevin Harding; Peisen S. Huang; Toru Yoshizawa, Editor(s)

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