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Proceedings Paper

Single photon emission and detection at the nanoscale utilizing semiconductor nanowires
Author(s): Michael E. Reimer; Maarten P. van Kouwen; Maria Barkelid; Moïra Hocevar; Maarten H. M. van Weert; Rienk E. Algra; Erik P. A. M. Bakkers; Mikael T. Björk; Heinz Schmid; Heike Riel; Leo P. Kouwenhoven; Val Zwiller
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Paper Abstract

We report recent progress toward on-chip single photon emission and detection in the near infrared utilizing semiconductor nanowires. Our single photon emitter is based on a single InAsP quantum dot embedded in a p-n junction defined along the growth axis of an InP nanowire. Under forward bias, light is emitted from the single quantum dot by electrical injection of electrons and holes. The optical quality of the quantum dot emission is shown to improve when surrounding the dot material by a small intrinsic section of InP. Finally, we report large multiplication factors in excess of 1000 from a single Si nanowire avalanche photodiode comprised of p-doped, intrinsic, and n-doped sections. The large multiplication factor obtained from a single Si nanowire opens up the possibility to detect a single photon at the nanoscale.

Paper Details

Date Published: 20 September 2010
PDF: 11 pages
Proc. SPIE 7808, Infrared Remote Sensing and Instrumentation XVIII, 780809 (20 September 2010); doi: 10.1117/12.868961
Show Author Affiliations
Michael E. Reimer, Technische Univ. Delft (Netherlands)
Maarten P. van Kouwen, Technische Univ. Delft (Netherlands)
Maria Barkelid, Technische Univ. Delft (Netherlands)
Moïra Hocevar, Technische Univ. Delft (Netherlands)
Maarten H. M. van Weert, Technische Univ. Delft (Netherlands)
Rienk E. Algra, Philips Research Nederland B.V. (Netherlands)
Erik P. A. M. Bakkers, Philips Research Nederland B.V. (Netherlands)
Mikael T. Björk, IBM Zürich Research Lab. (Switzerland)
Heinz Schmid, IBM Zürich Research Lab. (Switzerland)
Heike Riel, IBM Zürich Research Lab. (Switzerland)
Leo P. Kouwenhoven, Technische Univ. Delft (Netherlands)
Val Zwiller, Technische Univ. Delft (Netherlands)

Published in SPIE Proceedings Vol. 7808:
Infrared Remote Sensing and Instrumentation XVIII
Marija Strojnik; Gonzalo Paez, Editor(s)

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