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Proceedings Paper

Challenges in polarization ray tracing
Author(s): Russell A. Chipman
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Paper Abstract

New polarization methods allow the ray tracing simulation of polarization critical components, including multilayer biaxial films, anisotropic and gyrotropic crystals, electro-optical, and magneto-optical materials bring many new challenges.

Paper Details

Date Published: 9 September 2010
PDF: 6 pages
Proc. SPIE 7652, International Optical Design Conference 2010, 76521U (9 September 2010); doi: 10.1117/12.868939
Show Author Affiliations
Russell A. Chipman, College of Optical Sciences, The Univ. of Arizona (United States)


Published in SPIE Proceedings Vol. 7652:
International Optical Design Conference 2010

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