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Proceedings Paper

Simulation of laser ultrasonic for confirming the initial time and location during the generation phase
Author(s): Wei Liao; Dexing Yang; Wen Feng
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Paper Abstract

Process of laser ultrasonic generation was simulated in detail for confirming the exact time and location ultrasonic produced. The particular generating information in thin-film could help to accurately analyze the ultrasonic characteristics, especially in high pressure physics. Numerical models based on the two-dimensional axis-symmetry was built in cylinder coordinate system and calculated by finite element method (FEM). The duration and penetration-depth of pulse laser were considered instead of point approximation. In addition, parameters of material were set as functions related with temperature. According to the results, strain energy accumulated below the incidence point, so that the maximum amplitude of ultrasonic wave appeared few distances inside of the sample. Non-negligible errors were caused by that distances in velocity calculation. Without amendment, the errors increased with the broadening of pulse width and decreased with the growth of propagation distance. Therefore, the time ultrasonic generated should be fixed a head of the time that laser peak arrived. Furthermore, wave shape were easy to distinguish but inaccurately while the sample were covered with a transparent window.

Paper Details

Date Published: 17 November 2010
PDF: 7 pages
Proc. SPIE 7843, High-Power Lasers and Applications V, 78430I (17 November 2010); doi: 10.1117/12.868935
Show Author Affiliations
Wei Liao, Northwestern Polytechnical Univ. (China)
The Key Lab. of Space Applied Physics and Chemistry (China)
Dexing Yang, Northwestern Polytechnical Univ. (China)
The Key Lab. of Space Applied Physics and Chemistry (China)
Wen Feng, Northwestern Polytechnical Univ. (China)
The Key Lab. of Space Applied Physics and Chemistry (China)


Published in SPIE Proceedings Vol. 7843:
High-Power Lasers and Applications V
Upendra N. Singh; Dianyuan Fan; Jianquan Yao; Robert F. Walter, Editor(s)

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