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Proceedings Paper

A fast three-dimensional reconstruction method applied for the fabric defect detection
Author(s): Limei Song; Chunbo Zhang; Hui Xiong; Yiying Wei; Huawei Chen
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Paper Abstract

The fabric quality defect detection is very useful for improving the qualities of the products. It is also very important to increase the reputation and the economic benefits of a company. However, there are some shortcomings in the traditional manual detection methods, such as the low detection efficiency, the fatigue problem of the operator, and the detection inaccuracy, etc. The existing 2D image processing methods are difficult to solve the interference which is caused by non-defect case, just like the cloth folds, the flying thick silk floss, the noise from the background light and ambient light, etc. In order to solve those problem, the BCCSL (Binocular Camera Color Structure Light) method and SFMS (Shape from Multi Shading) method is proposed in this paper. The three-dimensional color coordinates of the fabric can be quickly and highly-precision obtained, thus to judge the defects shape and location. The BCCSL method and SFMS method can quickly obtain the three-dimensional coordinates' information of the fabric defects. The BCCSL method collects the 3D skeleton's information of a fabric image through the binocular video capture device and the color structured light projection device in real-time. And the details 3D coordinates of fabric outside strip structural are obtained through the proposed method SFMS. The interference information, such as the cloth fold, the flying thick silk floss, and the noise from the background light and ambient light can be excluded by using the three-dimensional defect identification. What is more, according to the characteristics of 3D structure of the defect, the fabric can be identified and classified. Further more, the possible problems from the production line can be summarized.

Paper Details

Date Published: 11 November 2010
PDF: 6 pages
Proc. SPIE 7855, Optical Metrology and Inspection for Industrial Applications, 785515 (11 November 2010); doi: 10.1117/12.868512
Show Author Affiliations
Limei Song, Tianjin Polytechnic Univ. (China)
Chunbo Zhang, Tianjin Polytechnic Univ. (China)
Hui Xiong, Tianjin Polytechnic Univ. (China)
Yiying Wei, Tianjin Polytechnic Univ. (China)
Huawei Chen, Tianjin Polytechnic Univ. (China)

Published in SPIE Proceedings Vol. 7855:
Optical Metrology and Inspection for Industrial Applications
Kevin Harding; Peisen S. Huang; Toru Yoshizawa, Editor(s)

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