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Proceedings Paper

3D profile measurement by using projection speckle pattern correlation method
Author(s): Eryi Hu; Lixia Zhu
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Paper Abstract

This paper is based on the triangulation method and the random digital speckles are projected on the reference plane and the surface of the object, with the digital speckle correlation principle, solving the height of object and reconstructing three-dimension of the object. Experimental results indicate that the digital speckle correlation technology in the measurement of three-dimensional objects is validity, reliability.

Paper Details

Date Published: 11 November 2010
PDF: 6 pages
Proc. SPIE 7855, Optical Metrology and Inspection for Industrial Applications, 78551F (11 November 2010); doi: 10.1117/12.868510
Show Author Affiliations
Eryi Hu, China Univ. of Mining and Technology (China)
Lixia Zhu, China Univ. of Mining and Technology (China)


Published in SPIE Proceedings Vol. 7855:
Optical Metrology and Inspection for Industrial Applications
Kevin Harding; Peisen S. Huang; Toru Yoshizawa, Editor(s)

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